首页> 外文OA文献 >Growth and characterization of dilute nitride GaNxP1−x nanowires and GaNxP1−x/GaNyP1−y core/shell nanowires on Si (111) by gas source molecular beam epitaxy
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Growth and characterization of dilute nitride GaNxP1−x nanowires and GaNxP1−x/GaNyP1−y core/shell nanowires on Si (111) by gas source molecular beam epitaxy

机译:气源分子束外延在Si(111)上生长和稀释氮化物GaNxP1-x纳米线和GaNxP1-x / GaNyP1-y核/壳纳米线的特性

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摘要

We have demonstrated self-catalyzed GaN xP1−x and GaN xP1−x/GaNyP1−y core/shell nanowire growth by gas-source molecular beam epitaxy. The growth window for GaN xP1−x nanowires was observed to be comparable to that of GaP nanowires (∼585 °C to ∼615 °C). Transmission electron microscopy showed a mixture of cubic zincblende phase and hexagonal wurtzite phase along the [111] growth direction in GaN xP1−x nanowires. A temperature-dependent photoluminescence (PL) study performed on GaN xP1−x/GaNyP1−y core/shell nanowires exhibited an S-shape dependence of the PL peaks. This suggests that at low temperature, the emission stems from N-related localized states below the conduction band edge in the shell, while at high temperature, the emission stems from band-to-band transition in the shell as well as recombination in the GaN xP1−x core.
机译:我们已经证明了通过气源分子束外延生长的自催化GaN xP1-x和GaN xP1-x / GaNyP1-y核/壳纳米线的生长。观察到GaN xP1-x纳米线的生长窗口与GaP纳米线的生长窗口相当(约585 C至615 C)。透射电子显微镜显示在GaN xP1-x纳米线中,沿着[111]生长方向的立方闪锌矿相和六方纤锌矿相的混合物。对GaN xP1-x / GaNyP1-y核/壳纳米线进行的随温度变化的光致发光(PL)研究显示PL峰具有S形依赖性。这表明在低温下,发射源于壳中导带边缘以下的N相关局部态,而在高温下,发射源于壳中的带间跃迁以及GaN中的复合xP1-x核心。

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